FUNCTIONAL CONTROL TECHNIQUE FOR FPGA TOTAL IONIZING DOSE TESTING
D.V. Bobrovsky, O.A. Kalashnikov, P.V.Nekrasov.
SEE Under Laser Radiation with Different Pulse
Durations and Wavelengths.
Alexander I. Chumakov, Dmitry V. Savchenkov, Alexander A. Pechenkin, Alexey L. Vasil’ev,
Alexey O. Akhmetov, Andrey N. Egorov, Oleg B. Mavritskiy, Alexander S. Tararaksin
and Andrey V. Yanenko
Switching DC-DC converters’ TID and SEE hardness investigation.
Alexander Y. Nikiforov, Dmitry V. Boychenko, Leonid N. Kessarinskiy
Total dose and SEE experimental data for switching DC-DC converters and its basic parts (MOSFETs , error amplifiers, PWMs , optocouplers ) is presented. The most total dose and SEE sensitive parts are revealed.
Total Ionizing Dose Effects in Ferroelectric Nonvolatile RAMs FM18L08.
A. Petrov, A. Ulanova, A. Orlov, A. Boruzdina.
Total Ionizing Dose Effects in Ferroelectric Nonvolatile RAMs FM18L08.
A.B. Boruzdina, A.A. Orlov, A.V. Ulanova, A.G. Petrov.
“PICO-4” Single Event Effects Evaluation and Testing Facility Based on Wavelength Tunable Picosecond Laser.
Andrey N. Egorov, Alexander I. Chumakov, Oleg B. Mavritskiy, Alexander A. Pechenkin,
Dmitriy O. Koltsov and Andrey V. Yanenko