АО "ЭНПО СПЭЛС"

FUNCTIONAL CONTROL TECHNIQUE FOR FPGA TOTAL IONIZING DOSE TESTING  

 

D.V. Bobrovsky, O.A. Kalashnikov, P.V.Nekrasov. 

SEE Under Laser Radiation with Different Pulse 

Durations and Wavelengths.

 

Alexander I. Chumakov, Dmitry V. Savchenkov, Alexander A. Pechenkin, Alexey L. Vasil’ev, 

Alexey O. Akhmetov, Andrey N. Egorov, Oleg B. Mavritskiy, Alexander S. Tararaksin 

and Andrey V. Yanenko 

Switching DC-DC converters’ TID and SEE hardness investigation.

 

Alexander Y. Nikiforov, Dmitry V. Boychenko, Leonid N. Kessarinskiy 

Total dose  and SEE experimental data for switching DC-DC converters and its basic parts (MOSFETs , error amplifiers, PWMs , optocouplers ) is presented. The most total dose and SEE sensitive parts are revealed.

Total Ionizing Dose Effects in Ferroelectric Nonvolatile RAMs FM18L08. 

 

A.B. Boruzdina, A.A. Orlov, A.V. Ulanova, A.G. Petrov. 

“PICO-4” Single Event Effects Evaluation and Testing Facility Based on Wavelength Tunable Picosecond Laser.

 

Andrey N. Egorov, Alexander I. Chumakov, Oleg B. Mavritskiy, Alexander A. Pechenkin,

Dmitriy O. Koltsov and Andrey V. Yanenko